Recent Enhancements to Interline and Electron Multiplying CCD Image Sensors †

This paper describes recent process modifications made to enhance the performance of interline and electron-multiplying charge-coupled-device (EMCCD) image sensors. By use of MeV ion implantation, quantum efficiency in the NIR region of the spectrum was increased by 2×, and image smear was reduced b...

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Detalles Bibliográficos
Autores principales: Stevens, Eric G., Clayhold, Jeffrey A., Doan, Hung, Fabinski, Robert P., Hynecek, Jaroslav, Kosman, Stephen L., Parks, Christopher
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5750797/
https://www.ncbi.nlm.nih.gov/pubmed/29215582
http://dx.doi.org/10.3390/s17122841

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5750797/
https://www.ncbi.nlm.nih.gov/pubmed/29215582
http://dx.doi.org/10.3390/s17122841

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