Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method †

A study of the random telegraph noise (RTN) of a 1.1 μm pitch, 8.3 Mpixel CMOS image sensor (CIS) fabricated in a 45 nm backside-illumination (BSI) technology is presented in this paper. A noise decomposition scheme is used to pinpoint the noise source. The long tail of the random noise (RN) distrib...

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Detalles Bibliográficos
Autores principales: Chao, Calvin Yi-Ping, Tu, Honyih, Wu, Thomas Meng-Hsiu, Chou, Kuo-Yu, Yeh, Shang-Fu, Yin, Chin, Lee, Chih-Lin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5751670/
https://www.ncbi.nlm.nih.gov/pubmed/29168778
http://dx.doi.org/10.3390/s17122704

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5751670/
https://www.ncbi.nlm.nih.gov/pubmed/29168778
http://dx.doi.org/10.3390/s17122704

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