Tensile stress effect on epitaxial BiFeO(3) thin film grown on KTaO(3)

Comprehensive crystal structural study is performed for BiFeO(3) (BFO) film grown on KTaO(3) (KTO) substrate using transmission electron microscopy (TEM) and x-ray diffraction (XRD). Nano-beam electron diffraction (NBED) combined with structure factor calculation and high resolution TEM images clear...

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Detalles Bibliográficos
Autores principales: Bae, In-Tae, Ichinose, Tomohiro, Han, Myung-Geun, Zhu, Yimei, Yasui, Shintaro, Naganuma, Hiroshi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5772049/
https://www.ncbi.nlm.nih.gov/pubmed/29343784
http://dx.doi.org/10.1038/s41598-018-19487-8

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5772049/
https://www.ncbi.nlm.nih.gov/pubmed/29343784
http://dx.doi.org/10.1038/s41598-018-19487-8

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