Interference experiment with asymmetric double slit by using 1.2-MV field emission transmission electron microscope

Advanced electron microscopy technologies have made it possible to perform precise double-slit interference experiments. We used a 1.2-MV field emission electron microscope providing coherent electron waves and a direct detection camera system enabling single-electron detections at a sub-second expo...

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Detalles Bibliográficos
Autores principales: Harada, Ken, Akashi, Tetsuya, Niitsu, Kodai, Shimada, Keiko, Ono, Yoshimasa A., Shindo, Daisuke, Shinada, Hiroyuki, Mori, Shigeo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5772058/
https://www.ncbi.nlm.nih.gov/pubmed/29343790
http://dx.doi.org/10.1038/s41598-018-19380-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5772058/
https://www.ncbi.nlm.nih.gov/pubmed/29343790
http://dx.doi.org/10.1038/s41598-018-19380-4

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