Electroviscous Dissipation in Aqueous Electrolyte Films with Overlapping Electric Double Layers

[Image: see text] We use dynamic atomic force microscopy (AFM) to investigate the forces involved in squeezing out thin films of aqueous electrolyte between an AFM tip and silica substrates at variable pH and salt concentration. From amplitude and phase of the AFM signal we determine both conservati...

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Detalles Bibliográficos
Autores principales: Liu, F., Klaassen, A., Zhao, C., Mugele, F., van den Ende, D.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2017
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5776519/
https://www.ncbi.nlm.nih.gov/pubmed/28976197
http://dx.doi.org/10.1021/acs.jpcb.7b07019

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5776519/
https://www.ncbi.nlm.nih.gov/pubmed/28976197
http://dx.doi.org/10.1021/acs.jpcb.7b07019

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