Real-Time Characterization Using in situ RHEED Transmission Mode and TEM for Investigation of the Growth Behaviour of Nanomaterials

A novel characterization technique using both in situ reflection high-energy electron diffraction (RHEED) transmission mode and transmission electron microscopy (TEM) has been developed to investigate the growth behaviour of semiconductor nanostructures. RHEED employed in transmission mode enables t...

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Detalles Bibliográficos
Autores principales: Jo, Janghyun, Tchoe, Youngbin, Yi, Gyu-Chul, Kim, Miyoung
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5786047/
https://www.ncbi.nlm.nih.gov/pubmed/29374190
http://dx.doi.org/10.1038/s41598-018-19857-2

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5786047/
https://www.ncbi.nlm.nih.gov/pubmed/29374190
http://dx.doi.org/10.1038/s41598-018-19857-2

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