Growth model and structure evolution of Ag layers deposited on Ge films

We investigated the crystallinity and optical parameters of silver layers of 10–35 nm thickness as a function 2–10 nm thick Ge wetting films deposited on SiO(2) substrates. X-ray reflectometry (XRR) and X-ray diffraction (XRD) measurements proved that segregation of germanium into the surface of the...

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Detalles Bibliográficos
Autores principales: Ciesielski, Arkadiusz, Skowronski, Lukasz, Górecka, Ewa, Kierdaszuk, Jakub, Szoplik, Tomasz
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2018
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5789383/
https://www.ncbi.nlm.nih.gov/pubmed/29441252
http://dx.doi.org/10.3762/bjnano.9.9

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5789383/
https://www.ncbi.nlm.nih.gov/pubmed/29441252
http://dx.doi.org/10.3762/bjnano.9.9

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