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Combined scanning probe electronic and thermal characterization of an indium arsenide nanowire
As electronic devices are downsized, physical processes at the interface to electrodes may dominate and limit device performance. A crucial step towards device optimization is being able to separate such contact effects from intrinsic device properties. Likewise, an increased local temperature due t...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5789438/ https://www.ncbi.nlm.nih.gov/pubmed/29441258 http://dx.doi.org/10.3762/bjnano.9.15 |