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Combined scanning probe electronic and thermal characterization of an indium arsenide nanowire

As electronic devices are downsized, physical processes at the interface to electrodes may dominate and limit device performance. A crucial step towards device optimization is being able to separate such contact effects from intrinsic device properties. Likewise, an increased local temperature due t...

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Detalles Bibliográficos
Autores principales: Wagner, Tino, Menges, Fabian, Riel, Heike, Gotsmann, Bernd, Stemmer, Andreas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5789438/
https://www.ncbi.nlm.nih.gov/pubmed/29441258
http://dx.doi.org/10.3762/bjnano.9.15

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