Quartz-based flat-crystal resonant inelastic x-ray scattering spectrometer with sub-10 meV energy resolution

Continued improvement of the energy resolution of resonant inelastic x-ray scattering (RIXS) spectrometers is crucial for fulfilling the potential of this technique in the study of electron dynamics in materials of fundamental and technological importance. In particular, RIXS is the only alternative...

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Detalles Bibliográficos
Autores principales: Kim, Jungho, Casa, D., Said, Ayman, Krakora, Rich, Kim, B. J., Kasman, Elina, Huang, Xianrong, Gog, T.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5792644/
https://www.ncbi.nlm.nih.gov/pubmed/29386577
http://dx.doi.org/10.1038/s41598-018-20396-z

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5792644/
https://www.ncbi.nlm.nih.gov/pubmed/29386577
http://dx.doi.org/10.1038/s41598-018-20396-z

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