Surface Properties of Nanostructured, Porous ZnO Thin Films Prepared by Direct Current Reactive Magnetron Sputtering

In this paper, the results of detailed X-ray photoelectron spectroscopy (XPS) studies combined with atomic force microscopy (AFM) investigation concerning the local surface chemistry and morphology of nanostructured ZnO thin films are presented. They have been deposited by direct current (DC) reacti...

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Detalles Bibliográficos
Autores principales: Kwoka, Monika, Lyson-Sypien, Barbara, Kulis, Anna, Maslyk, Monika, Borysiewicz, Michal Adam, Kaminska, Eliana, Szuber, Jacek
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5793629/
https://www.ncbi.nlm.nih.gov/pubmed/29342888
http://dx.doi.org/10.3390/ma11010131

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5793629/
https://www.ncbi.nlm.nih.gov/pubmed/29342888
http://dx.doi.org/10.3390/ma11010131

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