Growth and structural characterisation of Sr-doped Bi(2)Se(3) thin films

We grew Sr-doped Bi(2)Se(3) thin films using molecular beam epitaxy, and their high quality was verified using transmission electron microscopy. The thin films exhibited weak antilocalisation behaviours in magneto-resistance measurements, a typical transport signature of topological insulators, but...

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Detalles Bibliográficos
Autores principales: Wang, Meng, Zhang, Dejiong, Jiang, Wenxiang, Li, Zhuojun, Han, Chaoqun, Jia, Jinfeng, Li, Jixue, Qiao, Shan, Qian, Dong, Tian, He, Gao, Bo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5795016/
https://www.ncbi.nlm.nih.gov/pubmed/29391549
http://dx.doi.org/10.1038/s41598-018-20615-7

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5795016/
https://www.ncbi.nlm.nih.gov/pubmed/29391549
http://dx.doi.org/10.1038/s41598-018-20615-7

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