TEM and STEM Studies on the Cross-sectional Morphologies of Dual-/Tri-layer Broadband SiO(2) Antireflective Films

Dual-layer and tri-layer broadband antireflective (AR) films with excellent transmittance were successfully fabricated using base-/acid-catalyzed mixed sols and propylene oxide (PO) modified silica sols. The sols and films were characterized by scanning electron microscope (SEM), Fourier transform i...

Descripción completa

Detalles Bibliográficos
Autores principales: Wang, Shuangyue, Yan, Hongwei, Li, Dengji, Qiao, Liang, Han, Shaobo, Yuan, Xiaodong, Liu, Wei, Xiang, Xia, Zu, Xiaotao
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2018
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5809628/
https://www.ncbi.nlm.nih.gov/pubmed/29435672
http://dx.doi.org/10.1186/s11671-018-2442-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5809628/
https://www.ncbi.nlm.nih.gov/pubmed/29435672
http://dx.doi.org/10.1186/s11671-018-2442-4

Ejemplares similares