Lyapunov estimation for high-speed demodulation in multifrequency atomic force microscopy

An important issue in the emerging field of multifrequency atomic force microscopy (MF-AFM) is the accurate and fast demodulation of the cantilever-tip deflection signal. As this signal consists of multiple frequency components and noise processes, a lock-in amplifier is typically employed for its n...

Descripción completa

Detalles Bibliográficos
Autores principales: Harcombe, David M, Ruppert, Michael G, Ragazzon, Michael R P, Fleming, Andrew J
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2018
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5815288/
https://www.ncbi.nlm.nih.gov/pubmed/29515961
http://dx.doi.org/10.3762/bjnano.9.47

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5815288/
https://www.ncbi.nlm.nih.gov/pubmed/29515961
http://dx.doi.org/10.3762/bjnano.9.47

Ejemplares similares