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Lyapunov estimation for high-speed demodulation in multifrequency atomic force microscopy
An important issue in the emerging field of multifrequency atomic force microscopy (MF-AFM) is the accurate and fast demodulation of the cantilever-tip deflection signal. As this signal consists of multiple frequency components and noise processes, a lock-in amplifier is typically employed for its n...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5815288/ https://www.ncbi.nlm.nih.gov/pubmed/29515961 http://dx.doi.org/10.3762/bjnano.9.47 |