Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films

We have designed and developed a combined system of pulsed laser deposition (PLD) and non-contact atomic force microscopy (NC-AFM) for observations of insulator metal oxide surfaces. With this system, the long-period iterations of sputtering and annealing used in conventional methods for preparing a...

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Detalles Bibliográficos
Autores principales: Katsube, Daiki, Yamashita, Hayato, Abo, Satoshi, Abe, Masayuki
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2018
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5827635/
https://www.ncbi.nlm.nih.gov/pubmed/29527442
http://dx.doi.org/10.3762/bjnano.9.63

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5827635/
https://www.ncbi.nlm.nih.gov/pubmed/29527442
http://dx.doi.org/10.3762/bjnano.9.63

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