Immittance Data Validation using Fast Fourier Transformation (FFT) Computation – Synthetic and Experimental Examples

Exact data of an electric circuit (EC) model of RLC (resistor, inductor, capacitor) elements representing rational immittance of LTI (linear, time invariant) systems are numerically Fourier transformed to demonstrate within error bounds applicability of the Hilbert integral tranform (HT) and Kramers...

Descripción completa

Detalles Bibliográficos
Autores principales: Malkow, T., Papakonstantinou, G., Pilenga, A., Grahl‐Madsen, L., Tsotridis, G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2017
Materias:
Communications
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5861679/
https://www.ncbi.nlm.nih.gov/pubmed/29577006
http://dx.doi.org/10.1002/celc.201700629

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5861679/
https://www.ncbi.nlm.nih.gov/pubmed/29577006
http://dx.doi.org/10.1002/celc.201700629

Ejemplares similares