In situ full-field measurement of surface oxidation on Ni-based alloy using high temperature scanning probe microscopy

We use in situ scanning probe microscopy (SPM) to investigate the high temperature oxidation of Ni-based single crystal alloys at the micro-/nanoscale. SiO(2) micro-pillar arrays were pre-fabricated on the alloy surface as markers before the oxidation experiment. The SPM measurement of the oxidized...

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Detalles Bibliográficos
Autores principales: Li, Yan, Fang, Xufei, Qu, Zhe, Lu, Siyuan, Li, Haicheng, Zhu, Ting, Yu, Qingmin, Feng, Xue
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5923233/
https://www.ncbi.nlm.nih.gov/pubmed/29703923
http://dx.doi.org/10.1038/s41598-018-24656-w

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5923233/
https://www.ncbi.nlm.nih.gov/pubmed/29703923
http://dx.doi.org/10.1038/s41598-018-24656-w

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