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In situ full-field measurement of surface oxidation on Ni-based alloy using high temperature scanning probe microscopy
We use in situ scanning probe microscopy (SPM) to investigate the high temperature oxidation of Ni-based single crystal alloys at the micro-/nanoscale. SiO(2) micro-pillar arrays were pre-fabricated on the alloy surface as markers before the oxidation experiment. The SPM measurement of the oxidized...
| Autores principales: | , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5923233/ https://www.ncbi.nlm.nih.gov/pubmed/29703923 http://dx.doi.org/10.1038/s41598-018-24656-w |