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Extremely Low Frequency-Magnetic Field (ELF-MF) Exposure Characteristics among Semiconductor Workers

We assessed the exposure of semiconductor workers to extremely low frequency-magnetic fields (ELF-MF) and identified job characteristics affecting ELF-MF exposure. These were demonstrated by assessing the exposure of 117 workers involved in wafer fabrication (fab) and chip packaging wearing personal...

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Detalles Bibliográficos
Autores principales:	Choi, Sangjun, Cha, Wonseok, Park, Jihoon, Kim, Seungwon, Kim, Won, Yoon, Chungsik, Park, Ju-Hyun, Ha, Kwonchul, Park, Donguk
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2018
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5923684/ https://www.ncbi.nlm.nih.gov/pubmed/29614730 http://dx.doi.org/10.3390/ijerph15040642

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