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Voltage and partial pressure dependent defect chemistry in (La,Sr)FeO(3–δ) thin films investigated by chemical capacitance measurements
La(0.6)Sr(0.4)FeO(3–δ) (LSF) thin films of different thickness were prepared by pulsed laser deposition on yttria stabilized zirconia (YSZ) and characterized by using three electrode impedance spectroscopy. Electrochemical film capacitance was analyzed in relation to oxygen partial pressure (0.25 mb...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Royal Society of Chemistry
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5932982/ https://www.ncbi.nlm.nih.gov/pubmed/29671421 http://dx.doi.org/10.1039/c7cp07845e |