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Voltage and partial pressure dependent defect chemistry in (La,Sr)FeO(3–δ) thin films investigated by chemical capacitance measurements

La(0.6)Sr(0.4)FeO(3–δ) (LSF) thin films of different thickness were prepared by pulsed laser deposition on yttria stabilized zirconia (YSZ) and characterized by using three electrode impedance spectroscopy. Electrochemical film capacitance was analyzed in relation to oxygen partial pressure (0.25 mb...

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Detalles Bibliográficos
Autores principales:	Schmid, Alexander, Rupp, Ghislain M., Fleig, Jürgen
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Royal Society of Chemistry 2018
Materias:	Chemistry
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5932982/ https://www.ncbi.nlm.nih.gov/pubmed/29671421 http://dx.doi.org/10.1039/c7cp07845e

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