Artifacts in time-resolved Kelvin probe force microscopy

Kelvin probe force microscopy (KPFM) has been used for the characterization of metals, insulators, and semiconducting materials on the nanometer scale. Especially in semiconductors, the charge dynamics are of high interest. Recently, several techniques for time-resolved measurements with time resolu...

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Detalles Bibliográficos
Autores principales: Sadewasser, Sascha, Nicoara, Nicoleta, Solares, Santiago D
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2018
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5942368/
https://www.ncbi.nlm.nih.gov/pubmed/29765805
http://dx.doi.org/10.3762/bjnano.9.119

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5942368/
https://www.ncbi.nlm.nih.gov/pubmed/29765805
http://dx.doi.org/10.3762/bjnano.9.119

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