Tomographic and multimodal scattering-type scanning near-field optical microscopy with peak force tapping mode

Scattering-type scanning near-field optical microscopy (s-SNOM) enables nanoscale spectroscopic imaging and has been instrumental for many nano-photonic discoveries and in situ studies. However, conventional s-SNOM techniques with atomic force microscopy tapping mode operation and lock-in detections...

Descripción completa

Detalles Bibliográficos
Autores principales: Wang, Haomin, Wang, Le, Jakob, Devon S., Xu, Xiaoji G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5962580/
https://www.ncbi.nlm.nih.gov/pubmed/29784951
http://dx.doi.org/10.1038/s41467-018-04403-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5962580/
https://www.ncbi.nlm.nih.gov/pubmed/29784951
http://dx.doi.org/10.1038/s41467-018-04403-5

Ejemplares similares