An Alternative Lifetime Model for White Light Emitting Diodes under Thermal–Electrical Stresses

The lifetime prediction using accelerated degradation test (ADT) method has become a main issue for white light emitting diodes applications. This paper proposes a novel lifetime model for light emitting diodes (LEDs) under thermal and electrical stresses, where the junction temperature and driving...

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Detalles Bibliográficos
Autores principales: Yang, Xi, Sun, Bo, Wang, Zili, Qian, Cheng, Ren, Yi, Yang, Dezhen, Feng, Qiang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5978194/
https://www.ncbi.nlm.nih.gov/pubmed/29772726
http://dx.doi.org/10.3390/ma11050817

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5978194/
https://www.ncbi.nlm.nih.gov/pubmed/29772726
http://dx.doi.org/10.3390/ma11050817

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