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Study of CMOS-SOI Integrated Temperature Sensing Circuits for On-Chip Temperature Monitoring

This paper investigates the concepts, performance and limitations of temperature sensing circuits realized in complementary metal-oxide-semiconductor (CMOS) silicon on insulator (SOI) technology. It is shown that the MOSFET threshold voltage (V(t)) can be used to accurately measure the chip local te...

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Detalles Bibliográficos
Autores principales:	Malits, Maria, Brouk, Igor, Nemirovsky, Yael
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2018
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5982330/ https://www.ncbi.nlm.nih.gov/pubmed/29783742 http://dx.doi.org/10.3390/s18051629

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