A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction

The main focus of the presented work was the investigation of structure and residual stress gradients in the near-surface region of materials studied by X-ray diffraction. The multireflection method was used to measure depth-dependent stress variation in near-surface layers of a Ti sample (grade 2)...

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Detalles Bibliográficos
Autores principales: Marciszko, Marianna, Baczmański, Andrzej, Klaus, Manuela, Genzel, Christoph, Oponowicz, Adrian, Wroński, Sebastian, Wróbel, Mirosław, Braham, Chedly, Sidhom, Habib, Wawszczak, Roman
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2018
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5988007/
https://www.ncbi.nlm.nih.gov/pubmed/29896059
http://dx.doi.org/10.1107/S1600576718004193

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5988007/
https://www.ncbi.nlm.nih.gov/pubmed/29896059
http://dx.doi.org/10.1107/S1600576718004193

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