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A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction
The main focus of the presented work was the investigation of structure and residual stress gradients in the near-surface region of materials studied by X-ray diffraction. The multireflection method was used to measure depth-dependent stress variation in near-surface layers of a Ti sample (grade 2)...
| Autores principales: | , , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5988007/ https://www.ncbi.nlm.nih.gov/pubmed/29896059 http://dx.doi.org/10.1107/S1600576718004193 |