Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices

Advanced photonic probing techniques are of great importance for the development of non-contact wafer-scale testing of photonic chips. Ultrafast photomodulation has been identified as a powerful new tool capable of remotely mapping photonic devices through a scanning perturbation. Here, we develop p...

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Detalles Bibliográficos
Autores principales: Vynck, Kevin, Dinsdale, Nicholas J., Chen, Bigeng, Bruck, Roman, Khokhar, Ali Z., Reynolds, Scott A., Crudgington, Lee, Thomson, David J., Reed, Graham T., Lalanne, Philippe, Muskens, Otto L.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5993788/
https://www.ncbi.nlm.nih.gov/pubmed/29884878
http://dx.doi.org/10.1038/s41467-018-04662-2

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5993788/
https://www.ncbi.nlm.nih.gov/pubmed/29884878
http://dx.doi.org/10.1038/s41467-018-04662-2

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