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Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices
Advanced photonic probing techniques are of great importance for the development of non-contact wafer-scale testing of photonic chips. Ultrafast photomodulation has been identified as a powerful new tool capable of remotely mapping photonic devices through a scanning perturbation. Here, we develop p...
| Autores principales: | , , , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5993788/ https://www.ncbi.nlm.nih.gov/pubmed/29884878 http://dx.doi.org/10.1038/s41467-018-04662-2 |