Cargando…

Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

In this study we investigate the influence of the operation method in Kelvin probe force microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film transistors or on cross sections of functional s...

Descripción completa

Detalles Bibliográficos
Autores principales:	Axt, Amelie, Hermes, Ilka M, Bergmann, Victor W, Tausendpfund, Niklas, Weber, Stefan A L
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2018
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6009372/ https://www.ncbi.nlm.nih.gov/pubmed/29977714 http://dx.doi.org/10.3762/bjnano.9.172

Ejemplares similares

Nanoscale Characteristics of Ocular Lipid Thin Films Using Kelvin Probe Force Microscopy
por: Drolle, Elizabeth, et al.
Publicado: (2020)

Dual-heterodyne Kelvin probe force microscopy
por: Grévin, Benjamin, et al.
Publicado: (2023)

Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere
por: Knotek, Petr, et al.
Publicado: (2019)

Kelvin probe force microscopy in liquid using electrochemical force microscopy
por: Collins, Liam, et al.
Publicado: (2015)

Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space
por: Collins, Liam, et al.
Publicado: (2016)

Unraveling Spatiotemporal Transient Dynamics at the Nanoscale via Wavelet Transform-Based Kelvin Probe Force Microscopy
por: Biglarbeigi, Pardis, et al.
Publicado: (2023)

The role of the cantilever in Kelvin probe force microscopy measurements
por: Elias, George, et al.
Publicado: (2011)

Artifacts in time-resolved Kelvin probe force microscopy
por: Sadewasser, Sascha, et al.
Publicado: (2018)

Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy
por: Schulz, Fabian, et al.
Publicado: (2018)

Kelvin probe force microscopy of nanocrystalline TiO(2) photoelectrodes
por: Henning, Alex, et al.
Publicado: (2013)

Pulsed Force Kelvin Probe Force Microscopy through Integration of Lock-In Detection
por: Zahmatkeshsaredorahi, Amirhossein, et al.
Publicado: (2023)

Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination
por: Eftekhari, Zeinab, et al.
Publicado: (2023)

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
por: Wagner, Tino, et al.
Publicado: (2015)

AC Kelvin Probe Force Microscopy Enables Charge Mapping in Water
por: Hackl, Thomas, et al.
Publicado: (2022)

Visualization of π-hole in molecules by means of Kelvin probe force microscopy
por: Mallada, B., et al.
Publicado: (2023)

Potential Dip in Organic Photovoltaics Probed by Cross-sectional Kelvin Probe Force Microscopy
por: Lee, Jongjin, et al.
Publicado: (2018)

Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination
por: Jaafar, Miriam, et al.
Publicado: (2011)

Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy
por: Slobodian, Oleksandr M., et al.
Publicado: (2018)

Kelvin probe force microscopy: from single charge detection to device characterization
por: Sadewasser, Sascha, et al.
Publicado: (2018)

Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy
por: Miyazaki, Masato, et al.
Publicado: (2022)

Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals
por: Almadori, Yann, et al.
Publicado: (2018)

Direct observation of localized surface plasmon field enhancement by Kelvin probe force microscopy
por: Li, Da-Bing, et al.
Publicado: (2017)

Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy
por: Ritz, Christian, et al.
Publicado: (2020)

Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water
por: Kilpatrick, Jason I, et al.
Publicado: (2022)

Kelvin Probe Microscopy Investigation of Poly-Octylthiophene Aggregates
por: Bermejo, Joaquin, et al.
Publicado: (2022)

Noise performance of frequency modulation Kelvin force microscopy
por: Diesinger, Heinrich, et al.
Publicado: (2014)

Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors
por: Brouillard, Mélanie, et al.
Publicado: (2022)

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode
por: Stan, Gheorghe, et al.
Publicado: (2021)

Changes in Plasma Membrane Surface Potential of PC12 Cells as Measured by Kelvin Probe Force Microscopy
por: Tsai, Chia-Chang, et al.
Publicado: (2012)

Utilizing the surface potential of a solid electrolyte region as the potential reference in Kelvin probe force microscopy
por: Ishida, Nobuyuki
Publicado: (2022)

Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives
por: da Lisca, Mattia, et al.
Publicado: (2023)

High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy
por: Checa, Marti, et al.
Publicado: (2023)

Junction formation of Cu(3)BiS(3) investigated by Kelvin probe force microscopy and surface photovoltage measurements
por: Mesa, Fredy, et al.
Publicado: (2012)

Imaging the surface potential at the steps on the rutile TiO(2)(110) surface by Kelvin probe force microscopy
por: Miyazaki, Masato, et al.
Publicado: (2019)

Illustration of charge transfer in graphene-coated hexagonal ZnO photocatalysts using Kelvin probe force microscopy
por: Zhang, Yunlong, et al.
Publicado: (2018)

High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method
por: Park, Young Min, et al.
Publicado: (2020)

Cross-Sectional Investigations on Epitaxial Silicon Solar Cells by Kelvin and Conducting Probe Atomic Force Microscopy: Effect of Illumination
por: Narchi, Paul, et al.
Publicado: (2016)

Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation
por: Wrana, Dominik, et al.
Publicado: (2019)

High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads
por: Grévin, Benjamin, et al.
Publicado: (2016)

Measurement of polarization effects in dual-phase ceria-based oxygen permeation membranes using Kelvin probe force microscopy
por: Neuhaus, Kerstin, et al.
Publicado: (2021)

Cannot write session to /tmp/vufind_sessions/sess_d8befqn329ojkp8q25hnqkc455