Aberration correction considering curved sample surface shape for non-contact two-photon excitation microscopy with spatial light modulator

In this paper, excitation light wavefront modulation is performed considering the curved sample surface shape to demonstrate high-quality deep observation using two-photon excitation microscopy (TPM) with a dry objective lens. A large spherical aberration typically occurs when the refractive index (...

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Detalles Bibliográficos
Autores principales: Matsumoto, Naoya, Konno, Alu, Inoue, Takashi, Okazaki, Shigetoshi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6018692/
https://www.ncbi.nlm.nih.gov/pubmed/29915203
http://dx.doi.org/10.1038/s41598-018-27693-7

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6018692/
https://www.ncbi.nlm.nih.gov/pubmed/29915203
http://dx.doi.org/10.1038/s41598-018-27693-7

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