An Approach for Measuring the Dielectric Strength of OLED Materials

Surface roughness of electrodes plays a key role in the dielectric breakdown of thin-film organic devices. The rate of breakdown will increase when there are stochastic sharp spikes on the surface of electrodes. Additionally, surface having spiking morphology makes the determination of dielectric st...

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Detalles Bibliográficos
Autores principales: Sudheendran Swayamprabha, Sujith, Kumar Dubey, Deepak, Song, Wei-Chi, Lin, You-Ting, Ashok Kumar Yadav, Rohit, Singh, Meenu, Jou, Jwo-Huei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6025577/
https://www.ncbi.nlm.nih.gov/pubmed/29890755
http://dx.doi.org/10.3390/ma11060979

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6025577/
https://www.ncbi.nlm.nih.gov/pubmed/29890755
http://dx.doi.org/10.3390/ma11060979

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