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TEM Tomography of Pores with Application to Computational Nanoscale Flows in Nanoporous Silicon Nitride (NPN)

Silicon nanomembrane technologies (NPN, pnc-Si, and others) have been used commercially as electron microscopy (EM) substrates, and as filters with nanometer-resolution size cut-offs. Combined with EM, these materials provide a platform for catching or suspending nanoscale-size structures for analys...

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Detalles Bibliográficos
Autores principales: Madejski, Gregory, Lucas, Kilean, Pascut, Flavius C., Webb, Kevin F., McGrath, James L.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6027491/
https://www.ncbi.nlm.nih.gov/pubmed/29865242
http://dx.doi.org/10.3390/membranes8020026