Cargando…
Surface analysis and depth profiling using time-of-flight elastic recoil detection analysis with argon sputtering
The recent development of new advanced materials demands extensive effort in developing new analytical techniques that can provide insight into material composition at the nanoscale, particularly at surfaces and interfaces, which is important for both fabrication and material performance. Here, we p...
| Autores principales: | , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2018
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6039522/ https://www.ncbi.nlm.nih.gov/pubmed/29991819 http://dx.doi.org/10.1038/s41598-018-28726-x |