Compositional, ultrastructural and nanotechnological characterization of the SMA strain of Saccharomyces pastorianus: Towards a more complete fermentation yeast cell analysis

Nano scanning Auger microscopy (NanoSAM) and time-of-flight secondary ion mass spectrometry (TOF-SIMS) have been used in materials science research for some time, but NanoSAM, in particular, has only recently been applied to biological specimens. Here, the first concurrent utilization of NanoSAM, TO...

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Detalles Bibliográficos
Autores principales: Potter, Greg, Swart, Chantel W., van Wyk, Pieter W. J., Duvenhage, Mart-Mari, Coetsee, Elizabeth, Swart, Hendrik C., Budge, Suzanne M., Speers, R. Alex
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Public Library of Science 2018
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6040772/
https://www.ncbi.nlm.nih.gov/pubmed/29995965
http://dx.doi.org/10.1371/journal.pone.0200552

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6040772/
https://www.ncbi.nlm.nih.gov/pubmed/29995965
http://dx.doi.org/10.1371/journal.pone.0200552

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