Cargando…

Simple Optical Imaging of Nanoscale Features in Free-Standing Films

[Image: see text] Measuring thicknesses in thin films with high spatial and temporal resolution is of prime importance for understanding the structure and dynamics in thin films and membranes. In the present work, we introduce fluorescence-interferometry, a method that combines standard reflected li...

Descripción completa

Detalles Bibliográficos
Autores principales: Beltramo, Peter J., Vermant, Jan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2016
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6044614/
https://www.ncbi.nlm.nih.gov/pubmed/30023480
http://dx.doi.org/10.1021/acsomega.6b00125