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Simple Optical Imaging of Nanoscale Features in Free-Standing Films
[Image: see text] Measuring thicknesses in thin films with high spatial and temporal resolution is of prime importance for understanding the structure and dynamics in thin films and membranes. In the present work, we introduce fluorescence-interferometry, a method that combines standard reflected li...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical Society
2016
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6044614/ https://www.ncbi.nlm.nih.gov/pubmed/30023480 http://dx.doi.org/10.1021/acsomega.6b00125 |