Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles

We report on the investigation of the resistive switching (RS) in the ultrathin (≈5 nm in thickness) yttria-stabilized zirconia (YSZ) films with single layers of Au nanoparticles (NPs) by conductive atomic force microscopy (CAFM). Besides the butterfly-type hysteresis loops in the current-voltage (I...

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Detalles Bibliográficos
Autores principales: Filatov, Dmitry, Kazantseva, Inga, Antonov, Dmitry, Antonov, Ivan, Shenina, Maria, Pavlov, Dmitry, Gorshkov, Oleg
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi 2018
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6051002/
https://www.ncbi.nlm.nih.gov/pubmed/30057656
http://dx.doi.org/10.1155/2018/5489596

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6051002/
https://www.ncbi.nlm.nih.gov/pubmed/30057656
http://dx.doi.org/10.1155/2018/5489596

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