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Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles

We report on the investigation of the resistive switching (RS) in the ultrathin (≈5 nm in thickness) yttria-stabilized zirconia (YSZ) films with single layers of Au nanoparticles (NPs) by conductive atomic force microscopy (CAFM). Besides the butterfly-type hysteresis loops in the current-voltage (I...

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Detalles Bibliográficos
Autores principales: Filatov, Dmitry, Kazantseva, Inga, Antonov, Dmitry, Antonov, Ivan, Shenina, Maria, Pavlov, Dmitry, Gorshkov, Oleg
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6051002/
https://www.ncbi.nlm.nih.gov/pubmed/30057656
http://dx.doi.org/10.1155/2018/5489596
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author Filatov, Dmitry
Kazantseva, Inga
Antonov, Dmitry
Antonov, Ivan
Shenina, Maria
Pavlov, Dmitry
Gorshkov, Oleg
author_facet Filatov, Dmitry
Kazantseva, Inga
Antonov, Dmitry
Antonov, Ivan
Shenina, Maria
Pavlov, Dmitry
Gorshkov, Oleg
author_sort Filatov, Dmitry
collection PubMed
description We report on the investigation of the resistive switching (RS) in the ultrathin (≈5 nm in thickness) yttria-stabilized zirconia (YSZ) films with single layers of Au nanoparticles (NPs) by conductive atomic force microscopy (CAFM). Besides the butterfly-type hysteresis loops in the current-voltage (I-V) curves of the contact of the CAFM probe to the investigated film surface corresponding to the bipolar RS, the negative differential resistance (NDR) has been observed in the I-V curves of the AFM probe contact to the YSZ films with Au NPs in the conductive (“ON”) state. The NDR has been related to the resonant tunneling of electrons through the size-quantized energy states in the ultrafine (1 to 2 nm in diameter) Au NPs built in the conductive filaments in the YSZ films.
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spelling pubmed-60510022018-07-29 Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles Filatov, Dmitry Kazantseva, Inga Antonov, Dmitry Antonov, Ivan Shenina, Maria Pavlov, Dmitry Gorshkov, Oleg Scanning Research Article We report on the investigation of the resistive switching (RS) in the ultrathin (≈5 nm in thickness) yttria-stabilized zirconia (YSZ) films with single layers of Au nanoparticles (NPs) by conductive atomic force microscopy (CAFM). Besides the butterfly-type hysteresis loops in the current-voltage (I-V) curves of the contact of the CAFM probe to the investigated film surface corresponding to the bipolar RS, the negative differential resistance (NDR) has been observed in the I-V curves of the AFM probe contact to the YSZ films with Au NPs in the conductive (“ON”) state. The NDR has been related to the resonant tunneling of electrons through the size-quantized energy states in the ultrafine (1 to 2 nm in diameter) Au NPs built in the conductive filaments in the YSZ films. Hindawi 2018-07-02 /pmc/articles/PMC6051002/ /pubmed/30057656 http://dx.doi.org/10.1155/2018/5489596 Text en Copyright © 2018 Dmitry Filatov et al. https://creativecommons.org/licenses/by/4.0/ This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Research Article
Filatov, Dmitry
Kazantseva, Inga
Antonov, Dmitry
Antonov, Ivan
Shenina, Maria
Pavlov, Dmitry
Gorshkov, Oleg
Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles
title Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles
title_full Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles
title_fullStr Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles
title_full_unstemmed Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles
title_short Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles
title_sort conductive atomic force microscopy study of the resistive switching in yttria-stabilized zirconia films with au nanoparticles
topic Research Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6051002/
https://www.ncbi.nlm.nih.gov/pubmed/30057656
http://dx.doi.org/10.1155/2018/5489596
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