Cargando…
Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles
We report on the investigation of the resistive switching (RS) in the ultrathin (≈5 nm in thickness) yttria-stabilized zirconia (YSZ) films with single layers of Au nanoparticles (NPs) by conductive atomic force microscopy (CAFM). Besides the butterfly-type hysteresis loops in the current-voltage (I...
Autores principales: | Filatov, Dmitry, Kazantseva, Inga, Antonov, Dmitry, Antonov, Ivan, Shenina, Maria, Pavlov, Dmitry, Gorshkov, Oleg |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Hindawi
2018
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6051002/ https://www.ncbi.nlm.nih.gov/pubmed/30057656 http://dx.doi.org/10.1155/2018/5489596 |
Ejemplares similares
-
Atomic structure and composition of the yttria-stabilized zirconia (111) surface
por: Vonk, Vedran, et al.
Publicado: (2013) -
Effect of Bismuth Oxide on the Microstructure and Electrical Conductivity of Yttria Stabilized Zirconia
por: Liu, Liwei, et al.
Publicado: (2016) -
Development of Density-Functional Tight-Binding Parameters
for the Molecular Dynamics Simulation of Zirconia, Yttria, and Yttria-Stabilized
Zirconia
por: Hutama, Aulia Sukma, et al.
Publicado: (2021) -
The Effect of Yttria Content on Microstructure, Strength, and Fracture Behavior of Yttria-Stabilized Zirconia
por: Kulyk, Volodymyr, et al.
Publicado: (2022) -
Effect of Yttria Content on the Translucency and Masking Ability of Yttria-Stabilized Tetragonal Zirconia Polycrystal
por: Cho, Young-Eun, et al.
Publicado: (2020)