High resolution low kV EBSD of heavily deformed and nanocrystalline Aluminium by dictionary-based indexing

We demonstrate the capability of a novel Electron Backscatter Diffraction (EBSD) dictionary indexing (DI) approach by means of orientation mapping of a highly deformed graded microstructure in a shot peened Aluminium 7075-T651 alloy. A low microscope accelerating voltage was used to extract, for the...

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Detalles Bibliográficos
Autores principales: Singh, Saransh, Guo, Yi, Winiarski, Bartłomiej, Burnett, Timothy L., Withers, Philip J., De Graef, Marc
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6054629/
https://www.ncbi.nlm.nih.gov/pubmed/30030500
http://dx.doi.org/10.1038/s41598-018-29315-8

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6054629/
https://www.ncbi.nlm.nih.gov/pubmed/30030500
http://dx.doi.org/10.1038/s41598-018-29315-8

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