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Lithography for robust and editable atomic-scale silicon devices and memories
At the atomic scale, there has always been a trade-off between the ease of fabrication of structures and their thermal stability. Complex structures that are created effortlessly often disorder above cryogenic conditions. Conversely, systems with high thermal stability do not generally permit the sa...
Autores principales: | , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6056515/ https://www.ncbi.nlm.nih.gov/pubmed/30038236 http://dx.doi.org/10.1038/s41467-018-05171-y |
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author | Achal, Roshan Rashidi, Mohammad Croshaw, Jeremiah Churchill, David Taucer, Marco Huff, Taleana Cloutier, Martin Pitters, Jason Wolkow, Robert A. |
author_facet | Achal, Roshan Rashidi, Mohammad Croshaw, Jeremiah Churchill, David Taucer, Marco Huff, Taleana Cloutier, Martin Pitters, Jason Wolkow, Robert A. |
author_sort | Achal, Roshan |
collection | PubMed |
description | At the atomic scale, there has always been a trade-off between the ease of fabrication of structures and their thermal stability. Complex structures that are created effortlessly often disorder above cryogenic conditions. Conversely, systems with high thermal stability do not generally permit the same degree of complex manipulations. Here, we report scanning tunneling microscope (STM) techniques to substantially improve automated hydrogen lithography (HL) on silicon, and to transform state-of-the-art hydrogen repassivation into an efficient, accessible error correction/editing tool relative to existing chemical and mechanical methods. These techniques are readily adapted to many STMs, together enabling fabrication of error-free, room-temperature stable structures of unprecedented size. We created two rewriteable atomic memories (1.1 petabits per in(2)), storing the alphabet letter-by-letter in 8 bits and a piece of music in 192 bits. With HL no longer faced with this trade-off, practical silicon-based atomic-scale devices are poised to make rapid advances towards their full potential. |
format | Online Article Text |
id | pubmed-6056515 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-60565152018-07-26 Lithography for robust and editable atomic-scale silicon devices and memories Achal, Roshan Rashidi, Mohammad Croshaw, Jeremiah Churchill, David Taucer, Marco Huff, Taleana Cloutier, Martin Pitters, Jason Wolkow, Robert A. Nat Commun Article At the atomic scale, there has always been a trade-off between the ease of fabrication of structures and their thermal stability. Complex structures that are created effortlessly often disorder above cryogenic conditions. Conversely, systems with high thermal stability do not generally permit the same degree of complex manipulations. Here, we report scanning tunneling microscope (STM) techniques to substantially improve automated hydrogen lithography (HL) on silicon, and to transform state-of-the-art hydrogen repassivation into an efficient, accessible error correction/editing tool relative to existing chemical and mechanical methods. These techniques are readily adapted to many STMs, together enabling fabrication of error-free, room-temperature stable structures of unprecedented size. We created two rewriteable atomic memories (1.1 petabits per in(2)), storing the alphabet letter-by-letter in 8 bits and a piece of music in 192 bits. With HL no longer faced with this trade-off, practical silicon-based atomic-scale devices are poised to make rapid advances towards their full potential. Nature Publishing Group UK 2018-07-23 /pmc/articles/PMC6056515/ /pubmed/30038236 http://dx.doi.org/10.1038/s41467-018-05171-y Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Achal, Roshan Rashidi, Mohammad Croshaw, Jeremiah Churchill, David Taucer, Marco Huff, Taleana Cloutier, Martin Pitters, Jason Wolkow, Robert A. Lithography for robust and editable atomic-scale silicon devices and memories |
title | Lithography for robust and editable atomic-scale silicon devices and memories |
title_full | Lithography for robust and editable atomic-scale silicon devices and memories |
title_fullStr | Lithography for robust and editable atomic-scale silicon devices and memories |
title_full_unstemmed | Lithography for robust and editable atomic-scale silicon devices and memories |
title_short | Lithography for robust and editable atomic-scale silicon devices and memories |
title_sort | lithography for robust and editable atomic-scale silicon devices and memories |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6056515/ https://www.ncbi.nlm.nih.gov/pubmed/30038236 http://dx.doi.org/10.1038/s41467-018-05171-y |
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