Super-resolution visible photoactivated atomic force microscopy

Imaging the intrinsic optical absorption properties of nanomaterials with optical microscopy (OM) is hindered by the optical diffraction limit and intrinsically poor sensitivity. Thus, expensive and destructive electron microscopy (EM) has been commonly used to examine the morphologies of nanostruct...

Descripción completa

Detalles Bibliográficos
Autores principales: Lee, Seunghyun, Kwon, Owoong, Jeon, Mansik, Song, Jaejung, Shin, Seungjun, Kim, HyeMi, Jo, Minguk, Rim, Taiuk, Doh, Junsang, Kim, Sungjee, Son, Junwoo, Kim, Yunseok, Kim, Chulhong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2017
Materias:
Original Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6062039/
https://www.ncbi.nlm.nih.gov/pubmed/30167212
http://dx.doi.org/10.1038/lsa.2017.80

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6062039/
https://www.ncbi.nlm.nih.gov/pubmed/30167212
http://dx.doi.org/10.1038/lsa.2017.80

Ejemplares similares