Electronic contribution in heat transfer at metal-semiconductor and metal silicide-semiconductor interfaces

This work presents a direct measurement of the Kapitza thermal boundary resistance R(th), between platinum-silicon and platinum silicide-silicon interfaces. Experimental measurements were made using a frequency domain photothermal radiometry set up at room temperature. The studied samples consist of...

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Detalles Bibliográficos
Autores principales: Hamaoui, Georges, Horny, Nicolas, Hua, Zilong, Zhu, Tianqi, Robillard, Jean-François, Fleming, Austin, Ban, Heng, Chirtoc, Mihai
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6063978/
https://www.ncbi.nlm.nih.gov/pubmed/30054516
http://dx.doi.org/10.1038/s41598-018-29505-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6063978/
https://www.ncbi.nlm.nih.gov/pubmed/30054516
http://dx.doi.org/10.1038/s41598-018-29505-4

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