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Electronic contribution in heat transfer at metal-semiconductor and metal silicide-semiconductor interfaces
This work presents a direct measurement of the Kapitza thermal boundary resistance R(th), between platinum-silicon and platinum silicide-silicon interfaces. Experimental measurements were made using a frequency domain photothermal radiometry set up at room temperature. The studied samples consist of...
| Autores principales: | , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6063978/ https://www.ncbi.nlm.nih.gov/pubmed/30054516 http://dx.doi.org/10.1038/s41598-018-29505-4 |