Potential Dip in Organic Photovoltaics Probed by Cross-sectional Kelvin Probe Force Microscopy

Cross-sectional potential distribution of high open-circuit voltage bulk heterojunction photovoltaic device was measured using Kelvin probe force microscopy. Potential drop confined at cathode interface implies that photo-active layer is an effective p-type semiconductor. Potential values in field-f...

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Detalles Bibliográficos
Autores principales: Lee, Jongjin, Kong, Jaemin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2018
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6070447/
https://www.ncbi.nlm.nih.gov/pubmed/30069714
http://dx.doi.org/10.1186/s11671-018-2639-6

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6070447/
https://www.ncbi.nlm.nih.gov/pubmed/30069714
http://dx.doi.org/10.1186/s11671-018-2639-6

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