Cargando…
Precise and economic FIB/SEM for CLEM: with 2 nm voxels through mitosis
A portfolio is presented documenting economic, high-resolution correlative focused ion beam scanning electron microscopy (FIB/SEM) in routine, comprising: (i) the use of custom-labeled slides and coverslips, (ii) embedding of cells in thin, or ultra-thin resin layers for correlative light and electr...
| Autores principales: | , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer Berlin Heidelberg
2018
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6096567/ https://www.ncbi.nlm.nih.gov/pubmed/29789992 http://dx.doi.org/10.1007/s00418-018-1681-x |