Atomic number dependence of Z contrast in scanning transmission electron microscopy

Annular dark-field (ADF) imaging by scanning transmission electron microscopy (STEM) is a common technique for material characterization with high spatial resolution. It has been reported that ADF signal is proportional to the nth power of the atomic number Z, i.e., the Z contrast in textbooks and p...

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Detalles Bibliográficos
Autores principales: Yamashita, Shunsuke, Kikkawa, Jun, Yanagisawa, Keiichi, Nagai, Takuro, Ishizuka, Kazuo, Kimoto, Koji
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6098135/
https://www.ncbi.nlm.nih.gov/pubmed/30120323
http://dx.doi.org/10.1038/s41598-018-30941-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6098135/
https://www.ncbi.nlm.nih.gov/pubmed/30120323
http://dx.doi.org/10.1038/s41598-018-30941-5

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