Atomic number dependence of Z contrast in scanning transmission electron microscopy

Annular dark-field (ADF) imaging by scanning transmission electron microscopy (STEM) is a common technique for material characterization with high spatial resolution. It has been reported that ADF signal is proportional to the nth power of the atomic number Z, i.e., the Z contrast in textbooks and p...

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Autores principales: Yamashita, Shunsuke, Kikkawa, Jun, Yanagisawa, Keiichi, Nagai, Takuro, Ishizuka, Kazuo, Kimoto, Koji
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6098135/
https://www.ncbi.nlm.nih.gov/pubmed/30120323
http://dx.doi.org/10.1038/s41598-018-30941-5
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author Yamashita, Shunsuke
Kikkawa, Jun
Yanagisawa, Keiichi
Nagai, Takuro
Ishizuka, Kazuo
Kimoto, Koji
author_facet Yamashita, Shunsuke
Kikkawa, Jun
Yanagisawa, Keiichi
Nagai, Takuro
Ishizuka, Kazuo
Kimoto, Koji
author_sort Yamashita, Shunsuke
collection PubMed
description Annular dark-field (ADF) imaging by scanning transmission electron microscopy (STEM) is a common technique for material characterization with high spatial resolution. It has been reported that ADF signal is proportional to the nth power of the atomic number Z, i.e., the Z contrast in textbooks and papers. Here we first demonstrate the deviation from the power-law model by quantitative experiments of a few 2D materials (graphene, MoS(2) and WS(2) monolayers). Then we elucidate ADF signal of single atoms using simulations to clarify the cause of the deviation. Two major causes of the deviation from the power-law model will be pointed out. The present study provides a practical guideline for the usage of the conventional power-law model for ADF imaging.
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spelling pubmed-60981352018-08-23 Atomic number dependence of Z contrast in scanning transmission electron microscopy Yamashita, Shunsuke Kikkawa, Jun Yanagisawa, Keiichi Nagai, Takuro Ishizuka, Kazuo Kimoto, Koji Sci Rep Article Annular dark-field (ADF) imaging by scanning transmission electron microscopy (STEM) is a common technique for material characterization with high spatial resolution. It has been reported that ADF signal is proportional to the nth power of the atomic number Z, i.e., the Z contrast in textbooks and papers. Here we first demonstrate the deviation from the power-law model by quantitative experiments of a few 2D materials (graphene, MoS(2) and WS(2) monolayers). Then we elucidate ADF signal of single atoms using simulations to clarify the cause of the deviation. Two major causes of the deviation from the power-law model will be pointed out. The present study provides a practical guideline for the usage of the conventional power-law model for ADF imaging. Nature Publishing Group UK 2018-08-17 /pmc/articles/PMC6098135/ /pubmed/30120323 http://dx.doi.org/10.1038/s41598-018-30941-5 Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Yamashita, Shunsuke
Kikkawa, Jun
Yanagisawa, Keiichi
Nagai, Takuro
Ishizuka, Kazuo
Kimoto, Koji
Atomic number dependence of Z contrast in scanning transmission electron microscopy
title Atomic number dependence of Z contrast in scanning transmission electron microscopy
title_full Atomic number dependence of Z contrast in scanning transmission electron microscopy
title_fullStr Atomic number dependence of Z contrast in scanning transmission electron microscopy
title_full_unstemmed Atomic number dependence of Z contrast in scanning transmission electron microscopy
title_short Atomic number dependence of Z contrast in scanning transmission electron microscopy
title_sort atomic number dependence of z contrast in scanning transmission electron microscopy
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6098135/
https://www.ncbi.nlm.nih.gov/pubmed/30120323
http://dx.doi.org/10.1038/s41598-018-30941-5
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